585
585 TOTAL SILICON-HF
Si
Silicon concentration by nitric acid/hydrogen peroxide/hydrofluoric acid digestion and ICP analysis.
Summary: This method quantitatively determines the concentration of silicon utilizing a nitric acid/hydrogen peroxide/hydrofluoric acid microwave digestion and analysis by Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES). The method has a detection limit of 0.01% and on homogeneous sample material is generally reproducible within 8% (relative). The analysis is performed on 0.25 g sample material but 5 g is requested to allow for quality control and moisture determination.
Feng, X., Wu, S., Wharmby, A., and Wittmeier, A. Microwave digestion of plant and grain standard reference materials in nitric and hydrofluoric acids for multi-elemental determination by inductively coupled plasma mass spectrometry. Journal of Analytical Atomic Spectrometry, 1999, 14, pp. 939-946.